CHIPS Metrology Community – Florida Semiconductor Institute

Join us for a Special Session on CHIPS Metrology Projects Related to Microelectronics Advanced Packaging, Inspection, and Reliability

October 11, 2024 / October 11, 2024 by Naomi Villa

The CHIPS Metrology Program, one of the CHIPS for America Research and Development programs, is excited to bring a special half-day workshop to the IEEE PAINE 2024 conference on the afternoon of November 13. This session will feature short presentations from a sample of the more than 40 funded CHIPS Metrology research projects at the National Institute […]