Taste of Tech: Digital Twin Models for RF & Collaborating at the Edge

Taste of Tech Seminar Series

08/09/24

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Lunch will be provided during the seminar

Time

11:45 AM – 1:00 PM

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Talk 1: Join us for an exciting talk by Dr. John L. Volakis, a Professor in the College of Engineering and Computing at Florida International University (FIU). Dr. Volakis will deliver a presentation on “Digital Twin Models for RF,” focusing on design methodologies for vertical heterogeneous packaging of high-density RF/mm-Wave transceivers, integrating both high-power and low-power components.

Talk 2: Join us for an insightful talk by Dr. Toshikazu Nishida, Professor in the College of Electrical and Computer Engineering and Associate Dean of Academic Affairs at the University of Florida’s Herbert Wertheim College of Engineering. Dr. Nishida will present “Collaborating at the Edge,” where he will discuss the 10-year history and impact of the NSF-funded Multi-functional Integrated System Technology (MIST) Center and introduce the industry-guided development of the new Hardware Intelligence for Versatile Edge (HIVE) Center.

 

AGENDA